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TM/8 inch Probe Station

TM/8 is a dedicated probe station solution for users who need to accurately perform IV/CV testing of semiconductor components and materials and wafers in a short period of time. The combined semiconductor device analyzer can be used as a laboratory device analysis and test platform.
TM/8 probe station protects the high-quality contacts in the sample measurement cycle. It is designed with a very stable system platform and a perfect vibration isolation scheme that allows the user to achieve the desired measurement accuracy. The industry-standard probe base has optimized optics and no backlash X-Y-Z movement, and the contact separation drive achieves 1 μm repeatability, which is more accurate than semi-automatic probe station probe base placement. The high quality triaxial signal cable ensures that the test characteristic current reaches a low noise level of fA.
The slide table can provide heating and temperature change options to make the device easier to test. The slide table adopts a fast push-pull design, which can be adjusted by one hand, and has a highly flat surface and mobility so that beginners and users can easily operate.
The probe station design is scalable and expandable, such as scalable impedance measurements (with impedance analyzers) and capacitance tests up to fF levels. Protect users' one-time investments.

Application direction: analysis of college microelectronics teaching and research, laboratory chip failure.
Test device types: optoelectronic chips, GaN chips, RF chips, organic devices, OLEDs, etc.
Test parameters: IV, CV, S parameters, impedance parameters.

Technical parameters:
1.Can test Wafer size: 8 inches
2.Chuck XY stroke: 203.2mm*203.2mm
3. Fast Pull-out Y stage for easy Loading/Unloading
4. Chuck thets rotation 0" ~360 manual
5. Microscope mount X-Y Line travel 2 x2
6. Microscope Total Mag.' 20X 4000X
7. Upgrade: CCD Monitor. Thermal Chuck, Vibration Isolation Table. Shielding Box, Probe Cerd.